Krzysztof Kryszczuk

 

BIOGRAPHY

 

Krzysztof Kryszczuk obtained his doctorate in Pattern Recognition from the Swiss Federal Institute of Technology Lausanne (EPFL), Signal Processing Institute, in 2007. He is the co-founder and managing partner of PatternLab, a scientific consulting company based in Lausanne , Switzerland . Prior to joining EPFL, Krzysztof was a Research Engineer at the National University of Singapore. He obtained his M.S. degree in psychology (cognitive systems engineering) from the Rensselaer Polytechnic Institute in 2001, and the M.S. degree in electrical engineering from the Lublin Institute of Technology in 1999. In 2007, Krzysztof received the European Biometrics Forum Research Award for his work on conditionally-relevant features for pattern classification. In the course of his career, Krzysztof was a Visiting Scientist with the IBM Zurich Research Laboratory, and a Senior Scientist with the Nokia Research Center, and currently he also is Senior Research Associate and lectures at the Zurich University of Applied Science (ZHAW). Krzysztof is a founding board member of the Swiss Association for Analytics. His research interests include pattern recognition, machine learning, data mining and image processing.

Click here for Krzysztof's full CV

 

 

PUBLICATIONS

 

Replacing design rules in the VLSI design cycle, Paul Hurley and Krzysztof Kryszczuk, Proceedings of SPIE Vol. 8327, Design for Manufacturability through Design Process Integration VI, March 2012

 

Direct printability prediction in VLSI using features from orthogonal transforms, Krzysztof Kryszczuk and Paul Hurley and Robert Sayah, IAPR International Conference on Pattern Recognition, Istanbul, August 2010

 

Handling high dimensionality in biometric classification with multiple quality measures using Locality Preserving Projection, Krzysztof Kryszczuk and Norman Poh, accepted to: IEEE Conference on Computer Vision and Pattern Recognition, Workshop on Biometrics, San Francisco, June 2010

 

Estimation of the number of clusters using multiple clustering validity indices, Krzysztof Kryszczuk and Paul Hurley, 9th Internaltional Workshop on Multiple Classifier Systems, Cairo, April 2010

 

Impact of combining quality measures on biometric sample matching, K. Kryszczuk, J. Richiardi, A. Drygajlo, IEEE 3rd International Conference on Biometrics: Theory, Applications and Systems, Washington DC, September 2009

 

Improving biometric verification with class-independent quality information, K. Kryszczuk, A. Drygajlo, IET Signal Processng 3(4), 2009, Special Issue on Biometric Recognition, Page(s): 310 - 321 DOI : 10.1049/iet-spr.2008.0174

 

Static models of derivative-coordinates phase spaces for multivariate time series classification: an application to signature verification, J. Richiardi, K. Kryszczuk, A. Drygajlo, International Conference on Biometrics (ICB) 2009, Alghero, Italy, July 2009


Impact of feature correlations on separation between bivariate normal distributions, K. Kryszczuk, A. Drygajlo, International Conference on Pattern Recognition (ICPR) 2008, Tampa FL, USA, December 2008

 

What do quality measures predict in biometrics?, K. Kryszczuk, A. Drygajlo, 16th European Conference on Signal Processing EUSIPCO 2008, Lausanne, Switzerland, August 2008

 

On quality of quality measures for classification, K. Kryszczuk, A. Drygajlo, BIOID 2008, Roskilde, Denmark, May 2008

 

Credence estimation and error prediction in biometric identity verification, K. Kryszczuk, A. Drygajlo, Signal Processing, Volume 88 , Issue 4 (April 2008), Pages: 916-925, ISSN:0165-1684 , April 2008


Quality measures in unimodal and multimodal biometric verification, J. Richiardi, K. Kryszczuk, A. Drygajlo, 15th European Conference on Signal Processing EUSIPCO 2007, Poznan, Poland.


Improving classification with class-independent quality measures: Q − stack in face verification, K. Kryszczuk, A. Drygajlo, 2nd International Conference in Biometrics ICB2007, Seoul Korea, August 2007


Reliability estimation for multimodal error prediction and fusion, K. Kryszczuk, J.Richiardi, A. Drygajlo, 7th International Workshop on Pattern Recognition in Information Systems (PRIS-2007), Funchal, Portugal


Q − stack: uni- and multimodal classifier stacking with quality measures, K. Kryszczuk, A. Drygajlo, 7th International Workshop on Multiple Classifier Systems 2007, Prague, Czech Republic


Reliability-based decision fusion in multimodal biometric verification systems, K. Kryszczuk, J.Richiardi, P.Prodanov, A. Drygajlo, EURASIP Journal on Advances in Signal Processing Volume 2007 (2007), Article ID 86572, 9 pages, doi:10.1155/2007/86572


Quality Dependent Fusion of Intramodal and Multimodal Biometric Experts, J. Kittler, N. Poh, O. Fatukasi, K. Messer, K. Kryszczuk, J. Richiardi and A. Drygajlo, Proc. of SPIE Defense & Security, 9–13 April 2007, Orlando, Florida USA.


Singular point detection in fingerprints using quadrant change information, K. Kryszczuk, A. Drygajlo, Proc. of the International Conference on Pattern Recognition (ICPR) 2006, Hong Kong, China.


On Combining Evidence For Reliability Estimation In Face Verification, K. Kryszczuk, A. Drygajlo, Proc. of the 14th European Conference on Signal Processing (EUSIPCO) 2006, Florence, Italy


On Face Quality Measures, K. Kryszczuk, A. Drygajlo, Proc. 2nd Workshop on Multimodal User Authentication, Toulouse, France, 2006


Robust Method of Reference Point Localization in Fingerprints, K. Kryszczuk, A. Drygajlo, Proc. COST 275 Workshop on Biometrics on the Internet, Hatfield, UK, pp. 7-10, Oct 2005


Error Handling In Multimodal Biometric Systems Using Reliability Measures, K. Kryszczuk, J.Richiardi, P.Prodanov, A. Drygajlo, Proc. of the 13th European Conference on Signal Processing EUSPICO 2004, Antalya, Turkey, 4-8 September 2005.


Addressing the vulnerabilities of likelihood-ratio-based face verification, K. Kryszczuk, A. Drygajlo, AVBPA 2005, Rye Brook, NY 2005


Face authentication competition on the BANCA database, K. Messer, J. Kittler, M. Sadeghi, M. Hamouz, A. Kostyn, S. Marcel, S. Bengio, F. Cardinaux, C. Sanderson, N. Poh, Y. Rodriguez, K. Kryszczuk, J. Czyz, L. Vandendorpe, J. Ng, H. Cheung, and B. Tang , Proceedings of the International Conference on Biometric Authentication ICBA 2004


Study of the Distinctiveness of Level 2 and Level 3 Features in Fragmentary Fingerprint Comparison, K. Kryszczuk, P. Morier, A. Drygajlo, Proc. of the Biometrioc Authentication Workshop, ICCV 2004, May 15, 2004, Prague


Extraction of Level 2 and Level 3 Features for Fragmentary Fingerprint Comparison, K. Kryszczuk, A. Drygajlo and P. Morier, Proc. of COST275 meeting, March 25-26, 2004 Vigo, Spain


Color Correction For Face Detection Based on Human Visual Perception Metaphor, K. Kryszczuk, A. Drygajlo, Proc. of the Workshop on Multimodal User Authentication, Dec. 11-12, 2003, Santa Barbara, CA USA, pp. 138-143

 

In-Building Location Systems Are Realized with Fluorescent Lamp Infrastructures, M. Perkins, B. Stengel, B. O'Dea, K. Kryszczuk, Journal of the IES, vol. 31, no. 1, 2002, pp. 61-69

 

Detection of Slow Light Level Reduction, K. Kryszczuk, P. R. Boyce, Journal of the IES, vol. 31, no. 2, 2002, pp. 3-10

 

Detection of Slow Light Level Reduction, K. Kryszczuk, Conference of the IESNA, Vancouver, Canada, July 2002

 

 

 

 

PatternLab is a scientific consulting company, specialized in biometrics, pattern recognition, machine learning and data mining. For more information, visit
www.patternlab.ch
 


last updated : 2012-11-21