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Replacing design rules in the VLSI design cycle, Paul Hurley and Krzysztof Kryszczuk, Proceedings of SPIE Vol. 8327, Design for Manufacturability through Design Process Integration VI, March 2012
Direct printability prediction in VLSI using features from orthogonal transforms, Krzysztof Kryszczuk and Paul Hurley and Robert Sayah, IAPR International Conference on Pattern Recognition, Istanbul, August 2010
Handling high dimensionality in biometric classification with multiple quality
measures using Locality Preserving Projection, Krzysztof Kryszczuk and Norman Poh, accepted to: IEEE Conference on Computer Vision and Pattern Recognition, Workshop on Biometrics, San Francisco, June 2010
Estimation of the number of clusters using multiple clustering validity indices, Krzysztof Kryszczuk and Paul Hurley, 9th Internaltional Workshop on Multiple Classifier Systems, Cairo, April 2010
Impact of combining quality measures on biometric sample matching, K. Kryszczuk, J. Richiardi, A. Drygajlo, IEEE 3rd International Conference on Biometrics: Theory, Applications and Systems, Washington DC, September 2009
Improving biometric verification with class-independent quality information, K. Kryszczuk, A. Drygajlo, IET Signal Processng 3(4), 2009, Special Issue on Biometric Recognition, Page(s): 310 - 321 DOI : 10.1049/iet-spr.2008.0174
Static models of derivative-coordinates phase spaces for multivariate time series classification: an application to signature verification, J. Richiardi, K. Kryszczuk, A. Drygajlo, International Conference on Biometrics (ICB) 2009, Alghero, Italy, July 2009
Impact of feature correlations on separation between bivariate normal distributions, K. Kryszczuk, A. Drygajlo, International Conference on Pattern Recognition (ICPR) 2008, Tampa FL, USA, December 2008
What do quality measures predict in biometrics?, K. Kryszczuk, A. Drygajlo, 16th
European Conference on Signal Processing EUSIPCO 2008, Lausanne, Switzerland, August 2008
On quality of quality measures for classification, K. Kryszczuk, A. Drygajlo, BIOID 2008, Roskilde, Denmark, May 2008
Credence estimation and error prediction in biometric
identity verification, K. Kryszczuk, A. Drygajlo, Signal
Processing, Volume 88 , Issue 4 (April 2008), Pages: 916-925, ISSN:0165-1684 , April 2008
Quality measures in unimodal and multimodal biometric
verification, J. Richiardi, K. Kryszczuk, A. Drygajlo, 15th
European Conference on Signal Processing EUSIPCO 2007, Poznan, Poland.
Improving classification with class-independent quality
measures: Q − stack in face verification, K. Kryszczuk, A.
Drygajlo, 2nd International Conference in Biometrics ICB2007, Seoul Korea,
August 2007
Reliability estimation for multimodal error prediction and
fusion, K. Kryszczuk, J.Richiardi, A. Drygajlo, 7th International
Workshop on Pattern Recognition in Information Systems (PRIS-2007),
Funchal, Portugal
Q − stack: uni- and multimodal classifier stacking
with quality measures, K. Kryszczuk, A. Drygajlo, 7th International
Workshop on Multiple Classifier Systems 2007, Prague, Czech Republic
Reliability-based decision fusion in multimodal biometric
verification systems, K. Kryszczuk, J.Richiardi, P.Prodanov, A.
Drygajlo, EURASIP Journal on Advances in Signal Processing Volume 2007
(2007), Article ID 86572, 9 pages, doi:10.1155/2007/86572
Quality Dependent Fusion of Intramodal and Multimodal Biometric Experts,
J. Kittler, N. Poh, O. Fatukasi, K. Messer, K. Kryszczuk, J. Richiardi and
A. Drygajlo, Proc. of SPIE Defense & Security, 9–13 April 2007,
Orlando, Florida USA.
Singular point detection in fingerprints using quadrant
change information, K. Kryszczuk, A. Drygajlo, Proc. of the
International Conference on Pattern Recognition (ICPR) 2006, Hong Kong,
China.
On Combining Evidence For Reliability Estimation In Face
Verification, K. Kryszczuk, A. Drygajlo, Proc. of the 14th European
Conference on Signal Processing (EUSIPCO) 2006, Florence, Italy
On Face Quality Measures, K. Kryszczuk, A.
Drygajlo, Proc. 2nd Workshop on Multimodal User Authentication, Toulouse,
France, 2006
Robust Method of Reference Point Localization in Fingerprints, K.
Kryszczuk, A. Drygajlo, Proc. COST 275 Workshop on Biometrics on the
Internet, Hatfield, UK, pp. 7-10, Oct 2005
Error Handling In Multimodal Biometric Systems Using Reliability
Measures, K. Kryszczuk, J.Richiardi, P.Prodanov, A. Drygajlo, Proc. of
the 13th European Conference on Signal Processing EUSPICO 2004, Antalya,
Turkey, 4-8 September 2005.
Addressing the vulnerabilities of likelihood-ratio-based
face verification, K. Kryszczuk, A. Drygajlo, AVBPA 2005, Rye
Brook, NY 2005
Face authentication competition on the BANCA database,
K. Messer, J. Kittler, M. Sadeghi, M. Hamouz, A. Kostyn, S. Marcel, S.
Bengio, F. Cardinaux, C. Sanderson, N. Poh, Y. Rodriguez, K. Kryszczuk, J.
Czyz, L. Vandendorpe, J. Ng, H. Cheung, and B. Tang , Proceedings of the
International Conference on Biometric Authentication ICBA 2004
Study of the Distinctiveness of Level 2 and Level 3
Features in Fragmentary Fingerprint Comparison, K. Kryszczuk, P.
Morier, A. Drygajlo, Proc. of the Biometrioc Authentication Workshop, ICCV
2004, May 15, 2004, Prague
Extraction of Level 2 and Level 3 Features for Fragmentary Fingerprint
Comparison, K. Kryszczuk, A. Drygajlo and P. Morier, Proc. of COST275
meeting, March 25-26, 2004 Vigo, Spain
Color Correction For Face Detection Based on Human Visual
Perception Metaphor, K. Kryszczuk, A. Drygajlo, Proc. of the
Workshop on Multimodal User Authentication, Dec. 11-12, 2003, Santa
Barbara, CA USA, pp. 138-143
In-Building Location Systems Are Realized with Fluorescent Lamp Infrastructures, M. Perkins, B. Stengel, B. O'Dea, K. Kryszczuk, Journal of the IES, vol. 31, no. 1, 2002, pp. 61-69
Detection of Slow Light Level Reduction, K. Kryszczuk, P. R. Boyce,
Journal of the IES, vol. 31, no. 2, 2002, pp. 3-10
Detection of Slow Light Level Reduction, K. Kryszczuk, Conference of the IESNA, Vancouver, Canada, July 2002
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